MFX Specifications

Femtosecond Crystallography

Time-resolved scattering with hard X-rays

Macromolecular Crystallography

Forward scattering on fixed-mounted samples, 
and in liquid jets

Small Angle X-ray Scattering

Wide Angle X-ray Scattering

X-ray Emission Spectroscopy

5-11 keV for the 1^st harmonic*

Up to 25  keV for 2^nd and 3^rd harmonic

60 x 60 µm² (HxV) FWHM @ 8.3 keV

78 x 78 µm² (HxV) FWHM @ 2 keV

2 x 2 µrad² (HxV) FWHM @ 8.3 keV

~7 x 7 µrad² (HxV) FWHM @ 2 keV

120 , 60, 30, 10 Hz, Single shot mode

30-100 fs (high charge mode)

<10 fs (low charge mode)

1-4 mJ  (high charge mode)

~ 0.2 mJ  (low charge mode)

~1 x 10¹² (high charge mode @ 8.3 keV)

~1 x 10¹¹ (low charge mode @ 8.3 keV)

Beryllium Lenses in Hutch 4.5 (~1 µm focus)

0.7 x 0.7 µm² FWHM

~0.3 x 0.3 mrad² FWHM

5-11 keV (1^st harmonic using LCLS-I)

5-20 keV (1^st harmonic using LCLS-II)

11-25  keV (2^nd and 3^rd harmonic using LCLS-I)

20-25  keV (2^nd and 3^rd harmonic using LCLS-II)

~0.2% (bandwidth of the LCLS beam)
No monochromator currently

Atmospheric pressure

Fixed sample on grids at room temperature

Fixed sample on grids at cryogenic temperature

Helium atmosphere

Humidity control

Liquid Jets of various kinds

TBD